this specification documents the detailed requirements for analog device s space qualified die including die qualification as described for class k in mil - prf - 38534, a ppendix c, table c - ii except as modified herein. the manufacturing flow descr ibed in the standard d ie products program brochure http://www.analog.com/marketsolutions/militaryaerospace/pdf/die_broc.pdf is to be considered a part of this specifi cation. this data sheet specifically details the space grade version of this product. a more detailed operational description and a complete data sheet for commercial product grades can be found at www.analog .com/ad8041 the complete part number(s) of this specification follow: part number description ad8041 - 000c 160mhz rail - to - rail amplifier with disa ble
supply voltage (v s )........................................................... +12.6v input common mode range (v in ) .................................... vs storage temperature. ......................................... ......... .. ..... - 65 c to +125 c junction temperature (t j ). +175 c operating ambient temperature range (t a ) .................. - 55 c to +125 c absolute maximum ratings notes: 1/ stresses above the absolute maximum rating may cause perma nent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. in accordance with class - k version of mil - prf - 38534, appendix c, table c - ii, except as modified herein. (a) qual sample size and qual acceptance criteria C 10/0 (b) qual sample package C dip (c) pre - screen electrical test over temperature performed post - assembly prior to die qualification . table i notes: 1/ v s = 2.5v, t a = 25 c unless otherwise specified.
table ii notes: 1/ v s = 2.5v, v cm = 0v, unless otherwise specified. 5.1 htrb is not applicable for this drawing. 5.2 burn - in is per mil - std - 883 method 1015 test condition b or c. 5.3 steady state life test is per mil - std - 883 method 1005.
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